In Time, the expansion of This system to an entire wafer, or better, the use of a large resolution X-ray diffraction imaging (XRDI) procedure, to generate an entire 3D defect map of the Smart Cut layer could be helpful to show the defect density above The entire wafer. In response https://www.quora.com/profile/Trevor-Flatcher-2/Comparative-analysis-of-silicon-carbide-and-traditional-silicon-materials-Silicon-Carbide-vs-Traditional-Silicon-Mater